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High spatial resolution of the ferroelectric domain structure by confocal raman microscopy coupled whit atomic force microscopy
Fernando Rubio_Marcos
Rigoberto López
Alberto Moure
MARIA GUADALUPE NAVARRO ROJERO
Leandro Ramajo
Acceso Abierto
Atribución
http://digital.csic.es/handle/10261/135238
http://www.icors2014.org/
In order to investigate the structure and distribution of ferroelectric domains, a number of techniques have been usually applied, among them, scanning probe microscopy, environmental scanning microscopy, polarized light microscopy, transmission electron microscopy, atomic force microscopy and lately, scanning electron microscopy in the backscattered mode. In contrast to spectroscopic methods, the above mentioned techniques yield no or very limited chemical information. For complex domain structure, the purely topographic information is not sufficient to understand the distribution of all domains within a ceramic material. Different attempts have been made to combine the high spatial resolution of scanning probe microscopy with chemical information provided by spectroscopic techniques. Methods based on micro Raman spectroscopy give the possibility to study at a local scale the structural deformations of perovskites, which are induced both by the tilting of BO6 octahedra and by the cationic displacements. In this contribution we present and discusses the ferroelectric domain structure existing in different lead-free piezoceramics, such as (K,Na)NbO3(KNN), Bi4Ti3O12 (BIT), BaTiO3 (BT), and in single crystals (BaTiO3), studied by Confocal Raman Microscopy (CRM) coupled with Atomic Force Microscopy.
Institute of Chemical Engineering, Biotechnology and Environmental Technology
2014-08
Póster de congreso
XXIV International Conference on Raman Spectroscopie (2014)
Inglés
Público en general
MATERIALES CERÁMICOS
Versión publicada
publishedVersion - Versión publicada
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