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http://ciateq.repositorioinstitucional.mx/jspui/handle/1020/421| Alternative test flow for the electrical validation of USB 2.0 receiver circuits | |
| Marcos Alberto Camarena Rivera NOE AMIR RODRIGUEZ OLIVARES | |
| Acceso Abierto | |
| Atribución-NoComercial-CompartirIgual | |
| 1946-5351 https://www.academiajournals.com/pubtabasco2020 | |
| USB 2.0 Electrical validation Receiver sensitivity Host mode Squelch | |
| Electrical validation of USB 2.0 High-Speed receiver, used for multiple generations of Intel products, has been relying on the compliance sensitivity test method performed in Device Mode, as defined from USB Implementers Forum. This paper presents a new test strategy to develop a more simplified and convenient test method performed on Host Mode. A new test emerged as a better alternative to eliminate the dependencies from Windows OS and the driver for the extensible host controller and a device controller to enable Device Mode and achieve dual-role support. Deployed during 2019 at Intel Guadalajara Design Center, it dramatically reduced the required time to start validation activities of the receiver circuit during the early stages of products. The new method is intended to be the product of record solution for USB 2.0 receiver circuit for Intel post-silicon electrical validation across business units and product segments. | |
| Academia Journals | |
| 2020 | |
| Memoria de congreso | |
| Memorias del Congreso Internacional de Investigación Academia Journals Villahermosa 2020 (Villahermosa, Tabasco, 23 al 25 de septiembre) | |
| Inglés | |
| Público en general | |
| APLICACIONES ELÉCTRICAS | |
| Versión publicada | |
| publishedVersion - Versión publicada | |
| Aparece en las colecciones: | Memorias en Extenso |
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| Fichero | Tamaño | Formato | |
|---|---|---|---|
| Alternative test flow for the electrical validation.pdf | 1.15 MB | Adobe PDF | Visualizar/Abrir |